Francesco P. Andriulli
Politecnico di Torino, Italy
apm-eic@ieee.org
Christina Tang-Bernas
University of Southern California, California, USA
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Simon Adrian
University of Rostock, Germany
simon.adrian@uni-rostock.de
Eva Antonino-Daviu
Technical University of Valencia, Spain
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Hakan Bagci
King Abdullah University of Science and Technology, Saudi Arabia
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Yaniv Brick
Ben-Gurion University of the Negev, Beer-Sheva, Israel
ybrick@bgu.ac.il
Danilo Brizi
University of Pisa, Italy,
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Ruisi He
Beijing Jiaotong University, China
ruisi.he@bjtu.edu.cn
Yejun He
Shenzhen University, China
yjhe@szu.edu.cn
Wonbin Hong
Pohang University of Science and Technology, South Korea
whong@postech.ac.kr
Mengmeng Li
Nanjing University of Science and Technology, China
limengmeng@njust.edu.cn
Adrien Merlini
IMT Atlantique, France
adrien.merlini@imt-atlantique.fr
Sima Noghanian
PADT, Inc., USA
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Paolo Rocca
University of Trento, Italy
paolo.rocca@unitn.it
Felix Vega
Directed Energy Research Center Technology Innovation Institute
Abu Dhabi, United Arab Emirates
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Hao Xin
University of Arizona, Arizona, USA
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Abdulkadir Yucel
Nanyang Technological University, Singapore
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Asimina Kiourti
The Ohio State University, Ohio, USA
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Kristof Cools
Ghent University, Belgium
kristof.cools@ugent.be
Meisong Tong
Tongji University, China
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Anisha Apte
Synergy Microwave Corporation, New Jersey, USA
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Kwai Man Luk
City University of Hong Kong, Hong Kong
eekmluk@cityu.edu.hk
Sean Hum
University of Toronto, Canada
sean.hum@utoronto.ca
Christophe Caloz
KU Leuven, Belgium
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Stellenbosch University, South Africa
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Stoneware Limited, California,USA
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Trevor Bird
Antengenuity, Australia
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Octane Wireless, Maryland, USA
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Debatosh Guha
Institute of Radio Physics & Electronics, India
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Raymond Wasky
John Hopkins University, Maryland, USA
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Vikass Monebhurrun
CentraleSupélec, France
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Rajeev Bansal
University of Connecticut, USA
rajeev@engr.uconn.edu
Francesca Vipiana
Polytechnic University of Turin, Italy
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C.J. Reddy
Altair Engineering, Inc., Virginia, USA
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IEEE Antennas and Propagation Magazine publishes feature articles and columns that describe engineering activities within its scope, taking place in industry, government, and universities. All feature articles are subject to peer review. Emphasis is placed on providing the reader with a general understanding of either a particular subject or of the technical challenges being addressed by various organizations as well as their capabilities to cope with these challenges. Review, tutorial, and historical articles are welcome.
Digital Object Identifier 10.1109/MAP.2023.3291149